This equipment belongs to the equipment group for the characterization of material properties. Specifically is used to take very high resolution images, micro and nano scale, of the topography of all kinds of materials. The SEM can also analyze the composition of the materials in a semi-quantitative manner, identifying the elements present by the analysis of x-rays emitted by the sample.
Topographic characterization services can be provided with high-resolution images up to 500,000 magnifications

Manufacturer: HITACHI
Model: S4700Quantax QX2
Location: CENER Sarriguren