SIESS FE-SEM detail

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EQUIPMENT
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INFRASTRUCTURE & EQUIPMENT
CLASSIFICATION
COMMUNITY
FAQ

FE-SEM

High resolution scanning electron microscope

Manufacturer: Carl Zeiss
Model: Ultra Plus
Location: NOAIN

Materials Characterisation

Electron/Ion Microscopy

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SIESS is created by ADItech, coordinator of the Navarrese R&D&I System, SINAI, with the financing and promotion of the Government of Navarra

C/Tajonar, 20 - 31006 Pamplona (Navarra)

T +34 948 23 31 30 · info@aditech.com

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