SEM is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. EDX: To stimulate the emission of characteristic X-rays from a specimen a beam of X-rays is focused into the sample being studied.

Research institute: UPNA-Institute for Advanced Materials
Manufacturer: Jeol/Oxford
Model: JSM-5600LV
Location: UCTAI. Área de Caracterización Físico-Química. Edificio de el Sario.